It occurs when the semiconductor junction is overloaded by exceeding its power density and absorbs too much of the produced light energy, leading to melting and recrystallization of the semiconductor material at the facets of the laser. This is often colloquially referred to as. Catastrophic optical damage (COD), or catastrophic optical mirror damage (COMD), is a failure mode of high-power semiconductor lasers. Assessment and selection of manufacturers who adequately and consistently control their processes is important in eliminating these controllable defects. As a measured parameter of degradation, the current density is of great significance when searching for failure. Others say that because the laser is a DIODE, it will either work or not work at all (this does not, of course, include physical damage to the lens or focusing mech/electronics). Which observation is more correct? Or are there other modes of failure that are common? One reason for this query is due. In that period, Technology and Reliability ran a furious race, with the latter continuously trying to discover the new failure mechanisms intrinsic to the new devices, to invent suitable techniques to detect them, to model their kinetics, to find any precursor able to early point out any risk. In this paper, we characterize the COMD and COBD failure modes by examining the voltage changes at the current point where failure occurs, as well as by using the electroluminescent technique. Our study reveals that the voltage has an increase at the failure current point for COMD samples, in which.